Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Machine Vision Association of SME
Other Authors:	Batchelor, Bruce G., Miller, John W. V., Solomon, Susan Snell
Format:	Book
Language:	English
Published:	Bellingham, Wash. : SPIE, [1998]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3521.
Subjects:	Computer vision > Congresses. Engineering inspection > Automation > Congresses. Optical measurements > Congresses. Computer vision > Industrial applications > Congresses.

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