Cover Image

Three-dimensional imaging, optical metrology, and inspection IV : 2-3 November 1998, Boston, Massachusetts /

Bibliographic Details
Corporate Authors: Society of Manufacturing Engineers, Society of Photo-optical Instrumentation Engineers
Other Authors: Harding, Kevin G.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [1998]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3520.
Subjects:
Three-dimensional display systems > Congresses.
Lasers > Congresses.
Measurement > Congresses.
Triangulation > Congresses.
Engineering inspection > Congresses.
Description
Physical Description:ix, 304 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819429813