Three-dimensional imaging, optical metrology, and inspection IV : 2-3 November 1998, Boston, Massachusetts /

Bibliographic Details
Corporate Authors:	Society of Manufacturing Engineers, Society of Photo-optical Instrumentation Engineers
Other Authors:	Harding, Kevin G.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [1998]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3520.
Subjects:	Three-dimensional display systems > Congresses. Lasers > Congresses. Measurement > Congresses. Triangulation > Congresses. Engineering inspection > Congresses.

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