Proceedings, International Test Conference 1998.

Bibliographic Details
Corporate Author:	International Test Conference Washington, D.C.
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, DC : International Test Conference, ©1998.
Subjects:	Integrated circuits > Testing > Congresses. Microprocessors > Testing > Congresses. Embedded computer systems > Testing > Congresses. Embedded computer systems > Testing. Integrated circuits > Testing. Microprocessors > Testing. Circuits intégrés > Essais > Congrès. Conference papers and proceedings.
Online Access:	IEEE Xplore IEEE Xplore

Description
Physical Description:	xvi, 1179 pages : illustrations ; 28 cm Also available via the World Wide Web with additional title: Test Conference, 1998, proceedings, International.
Bibliography:	Includes bibliographical references and index.
ISBN:	0780350928 9780780350922 0780350936 9780780350939 0780350944 9780780350946