Proceedings, International Test Conference 1998.

Bibliographic Details
Corporate Author:	International Test Conference Washington, D.C.
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, DC : International Test Conference, ©1998.
Subjects:	Integrated circuits > Testing > Congresses. Microprocessors > Testing > Congresses. Embedded computer systems > Testing > Congresses. Embedded computer systems > Testing. Integrated circuits > Testing. Microprocessors > Testing. Circuits intégrés > Essais > Congrès. Conference papers and proceedings.
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