Scanning electron microscopy : physics of image formation and microanalysis /

Bibliographic Details

Main Author:	Reimer, Ludwig, 1928-
Format:	Book
Language:	English
Published:	Berlin ; New York : Springer, [1998]
Edition:	2nd completely rev. and updated ed.
Series:	Springer series in optical sciences ; v. 45.
Subjects:	Scanning electron microscopy.