Scattering and surface roughness II : 21-23 July 1998, San Diego, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Gu, Zu-Han, Maradudin, Alexei A., 1931-
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1998]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3426.
Subjects:	Surface roughness > Measurement > Congresses. Light > Scattering > Congresses. Electromagnetic waves > Scattering > Congresses.

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