Cover Image

Advances in optical beam characterization and measurements : 14 July 1998, Québec, Canada /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Canadian Association of Physicists, Defence Research Establishment Valcartier
Other Authors: Piché, Michel
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1998]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3418.
Subjects:
Surfaces (Technology) > Analysis > Congresses.
Laser pulses, Ultrashort > Congresses.
Beam optics > Congresses.
Description
Physical Description:v, 128 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819428728