Advances in optical beam characterization and measurements : 14 July 1998, Québec, Canada /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Canadian Association of Physicists, Defence Research Establishment Valcartier
Other Authors:	Piché, Michel
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1998]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3418.
Subjects:	Surfaces (Technology) > Analysis > Congresses. Laser pulses, Ultrashort > Congresses. Beam optics > Congresses.

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