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X-ray microscopy and spectromicroscopy : status report from the fifth international conference, Würzburg, August 19-23, 1996 /

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Bibliographic Details
Corporate Author: International Conference of X-Ray Microscopy and Spectromicroscopy
Other Authors: Thieme, Jürgen
Format: Conference Proceeding Book
Language:English
Published: Berlin ; New York : Springer, [1998]
Subjects:
X-ray microscopy > Congresses.

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Call Number: QH212.X2 X25 1998
 
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QH212.X2 X25 1998 Available