Beyond internal consistency reliability : rationale and user's guide for Multitrait Analysis Program on the microcomputer /

Bibliographic Details
Main Author:	Hays, Ron D.
Corporate Author:	Rand Corporation
Other Authors:	Hayashi, Toshi
Format:	Book
Language:	English
Published:	Santa Monica, CA : Rand Corporation, [1990]
Series:	Rand note ; N-3155-RC.
Subjects:	Scale analysis (Psychology) > Computer programs. Multitrait Analysis Program (Computer program)

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