Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Porcessing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

Bibliographic Details
Corporate Author:	International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
Other Authors:	Donecker, J., Rechenberg, I.
Format:	Conference Proceeding Book
Language:	English
Published:	Bristol ; Philadelphia : Institute of Physics Publishing, [1998]
Series:	Institute of Physics conference series ; no. 160.
Subjects:	Semiconductors > Defects > Congresses. Image processing > Congresses.

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