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Atomic resolution microscopy of surfaces and interfaces : symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A. /

Bibliographic Details
Other Authors: Smith, David J., 1948-
Format: Book
Language:English
Published: Pittsburgh, Pa. : Materials Research Society, [1997]
Series:Materials Research Society symposia proceedings ; v. 466.
Subjects:
Materials > Microscopy > Congresses.
Atom-probe field ion microscopy > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: TA417.23 .A86 1997
 
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TA417.23 .A86 1997 Available