Scientific detection of fakery in art : 29-30 January 1998, San Jose, California /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, IS & T--the Society for Imaging Science and Technology
Other Authors:	McCrone, Walter C., Chartier, Duane R., Weiss, Richard J. (Richard Jerome), 1923-
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1998]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3315.
Subjects:	Art > Radiography > Congresses. Art > Forgeries > Congresses. Art > Expertising > Congresses. Painting > Expertising > Congresses. Expertising, X-ray > Congresses. Science and the arts > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3315.toc

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