Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A. /

Bibliographic Details
Other Authors:	Diaz de la Rubia, Tomas
Format:	Book
Language:	English
Published:	Pittsburgh, Pa. : Materials Research Society, [1997]
Series:	Materials Research Society symposia proceedings.
Subjects:	Semiconductors > Defects > Congresses. Semiconductor doping > Congresses. Silicon crystals > Defects > Congresses.

Remote Storage