Process control and sensors for manufacturing : 31 March-1 April 1998, San Antonio, Texas /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, National Institute of Standards and Technology (U.S.)
Other Authors:	Bossi, R. H., Pepper, David M.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1998]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3399.
Subjects:	Process control > Automation > Congresses. Detectors > Industrial applications > Congresses. Manufacturing industries > Quality control > Congresses.

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