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Defect oriented testing for CMOS analog and digital circuits /

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Bibliographic Details
Main Author: Sachdev, Manoj
Format: Book
Language:English
Published: Boston : Kluwer Academic, [1998]
Series:Frontiers in electronic testing.
Subjects:
Metal oxide semiconductors, Complementary > Testing.
Metal oxide semiconductors, Complementary > Defects.
Linear integrated circuits > Testing.
Digital integrated circuits > Testing.

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Call Number: TK7871.99.M44 S23 1998
 
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TK7871.99.M44 S23 1998 Available