Cover Image

High resolution x-ray diffractometry and topography /

Bibliographic Details
Main Author: Bowen, Keith, D.
Other Authors: Tanner, B. K. (Brian Keith)
Format: Book
Language:English
Published: Bristol, PA : Taylor & Francis, [1998]
Subjects:
X-rays > Diffraction.
Crystals.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: QD921 .B69 1998
 
Call Number Status Get It
QD921 .B69 1998 Available