Thermosense XX : 14-16 April 1998, Orlando, Florida /

Bibliographic Details
Corporate Authors:	International Conference on Thermal Sensing and Imaging Diagnostic Applications Orlando, Fla., Society of Photo-optical Instrumentation Engineers
Other Authors:	Snell, John R., Wurzbach, Richard N.
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1998]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3361.
Subjects:	Thermography > Congresses. Nondestructive testing > Congresses.

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