International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine /
| Corporate Authors: | , , , , |
|---|---|
| Other Authors: | , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[1998]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 3359. |
| Subjects: |
Remote Storage
| Call Number: |
TK7871 .I574 1997 |
|
|---|---|---|
| Call Number | Status | Get It |
| TK7871 .I574 1997 | Available | |