Cover Image

Ultrafast phenomena in semiconductors II : 28-29 January 1998, San Jose, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Tsen, Kong Thon, Fetterman, Harold R.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1998]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3277.
Subjects:
Semiconductors > Congresses.
Picosecond pulses > Congresses.
Quantum wells > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3377.toc
Description
Physical Description:ix, 316 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819427160