Ultrafast phenomena in semiconductors II : 28-29 January 1998, San Jose, California /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Tsen, Kong Thon, Fetterman, Harold R.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [1998]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 3277.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3377.toc

Internet

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3377.toc

Remote Storage

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Call Number: QC610.9 .U49 1998
 
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QC610.9 .U49 1998 Available