Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A. /

Bibliographic Details
Other Authors:	Clement, J. Joseph
Format:	Book
Language:	English
Published:	Pittsburgh, Pa. : Materials Research Society, [1997]
Series:	Materials Research Society symposia proceedings.
Subjects:	Microelectronics > Reliability > Congresses. Microelectronics > Materials > Testing > Congresses. Microstructure > Congresses. Metallizing > Congresses.

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