Cover Image

Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Society of Photo-optical Instrumentation Engineers. Singapore Chapter, Institute of Physics, Singapore, Society of Photo-optical Instrumentation Engineers. Japan Chapter, Nanyang Technological University
Other Authors:	Ho, Anthony Tung-Shuen, Rao, Sreenivas, Lee, Ming Cheng
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1997]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3185.
Subjects:	Optical detectors > Industrial applications > Congresses. Imaging systems > Industrial applications > Congresses. Quality control > Optical methods > Congresses.

Similar Items

Optical inspection and micromeasurements : 10-14 June 1996, Besançon, France /
Published: (1996)

Optical inspection and testing : proceedings of a conference held 17-18 November 1992, Boston, Massachusetts /
Published: (1993)

Industrial optical sensors for metrology and inspection : 31 October-1 November 1994, Boston, Massachusetts /
Published: (1995)

Industrial inspection : proceedings, ECO1, 19-20 September 1988, Hamburg, Federal Republic of Germany /
Published: (1989)

Eighth International Conference on Quality Control by Artificial Vision : 23-25 May 2007, Le Creusot, France /
Published: (2007)

Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG /
Published: (1997)

Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinburg, Tennessee, USA /
Published: (2003)

Industrial optical sensing and metrology : applications and integration, 10 September 1993, Boston, Massachusetts /
Published: (1993)

Microsystems engineering : metrology and inspection III : 23-25 June 2003, Munich, Germany /
Published: (2003)

Industrial inspection II : 12-13 March 1990, The Hague, The Netherlands /
Published: (1990)

Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany /
Published: (2003)

Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany /
Published: (2001)

Optical measurement systems for industrial inspection : 16-17 June 1999, Munich, Germany /
Published: (1999)

Optical measurement systems for industrial inspection IV : 13-17 June 2005, Munich, Germany /
Published: (2005)

Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany /
Published: (2007)

Optical measurement systems for industrial inspection II : applications in production engineering : 20-21 June 2001, Munich, Germany /
Published: (2001)

Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001, Munich, Germany /
Published: (2001)

Process control and diagnostics : 18-19 September 2000, Santa Clara, USA /
Published: (2000)

Instruments for optics and optoelectronic inspection and control : 8-10 November 2000, Beijing, China /
Published: (2000)

Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California /
Published: (1999)

International Conference on Sensors and Control Techniques (ICSC 2000) : 19-21 June 2000, Wuhan, China /
Published: (2000)

Sensors and controls for intelligent manufacturing : 7 November 2000, Boston, USA /
Published: (2001)

Sensors and controls for intelligent manufacturing II : 28 October 2001, Boston, USA /
Published: (2001)

Sensors and controls for intelligent machining, agile manufacturing, and mechatronics : 4-5 November 1998, Boston, Massachusetts /
Published: (1998)

Sensors and controls for intelligent machining and manufacturing mechatronics : 19-20 September 1999, Boston, Massachusetts /
Published: (1999)

Automated optical inspection for industry : theory, technology, and applications II : 16-19 September 1998, Beijing, China /
Published: (1998)

Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California /
Published: (1998)

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California /
Published: (2000)

Optical online industrial process monitoring : 22 September 1999, Boston, Massachusetts /
Published: (1999)

Optical methods for industrial processes : 6-7 November 2000, Boston, USA /
Published: (2001)

Vision systems : applications : 13 June 1996, Besançon, France /
Published: (1996)

Machine vision applications in industrial inspection IX : 22-23 January 2001, San Jose, USA /
Published: (2001)

Machine vision applications in industrial inspection X : 21-22 January 2002, San Jose, USA /
Published: (2002)

Laser metrology and inspection : 14-15 June 1999, Munich, Germany /
Published: (1999)

Machine vision applications in industrial inspection XIII : 17-18 January 2005, San Jose, California, USA /
Published: (2005)

Machine vision applications in industrial inspection XII : 21-22 January 2004, San Jose, California, USA /
Published: (2004)

Machine vision applications in industrial inspection XI : 22-24 January 2003, Santa Clara, California, USA /
Published: (2003)

Machine vision applications in industrial inspection XV : 29-30 January 2007, San Jose, California, USA /
Published: (2007)

Machine vision applications in industrial inspection XIV : 16-17 January, 2006, San Jose, California, USA /
Published: (2006)

Automatic optical inspection : 15-18 April 1986, Innsbruck, Austria /
Published: (1986)