Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Society of Photo-optical Instrumentation Engineers. Singapore Chapter, Institute of Physics, Singapore, Society of Photo-optical Instrumentation Engineers. Japan Chapter, Nanyang Technological University
Other Authors:	Ho, Anthony Tung-Shuen, Rao, Sreenivas, Lee, Ming Cheng
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1997]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3185.
Subjects:	Optical detectors > Industrial applications > Congresses. Imaging systems > Industrial applications > Congresses. Quality control > Optical methods > Congresses.

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