Cover Image

Proceedings /

Bibliographic Details
Previous Title:International Workshop on Defect and Fault Tolerance in VLSI Systems. Proceedings
Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, IEEE Computer Society, IEEE Computer Society. Fault-Tolerant Computing Technical Committee
Format: Conference Proceeding
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press, [1996-]
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Integrated circuits > Fault tolerance > Congresses.
Online Availability: Check for online availability
Description
Published:1996-
Physical Description:volumes : illustrations ; 23 cm.
Also issued by subscription, in PDF format, via the World Wide Web.
Also issued online.
Publication Frequency:Annual
ISSN:1550-5774
1063-6722