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Proceedings /

Bibliographic Details
Previous Title:International Workshop on Defect and Fault Tolerance in VLSI Systems. Proceedings
Corporate Authors: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, IEEE Computer Society, IEEE Computer Society. Fault-Tolerant Computing Technical Committee
Format: Conference Proceeding
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press, [1996-]
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Integrated circuits > Fault tolerance > Congresses.
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Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .D415
Notes: Subscription converted to electronic format.
Library Owns: TK7874 .D415 (1996-1997,1999-2001; 17th-18th (2002-2003))
Call Number Status Get It
TK7874 .D415 1997 Available
TK7874 .D415 1996 Available
TK7874 .D415 17th 2002 Available
TK7874 .D415 18th 2003 Available
TK7874 .D415 1999 Available
TK7874 .D415 2000 Available
TK7874 .D415 2001 Available