Efficient use of full scan in transition fault testing /
| Main Author: | Saxena, Jayashree |
|---|---|
| Other Authors: | Pradhan, Dhiraj K. |
| Format: | Book |
| Language: | English |
| Published: |
College Station, Tex. :
Texas A & M University, Computer Science Dept.,
[1994]
|
| Series: | Technical report. Texas A & M University. Computer Science Dept. ;
TAMU 94-011 |
| Subjects: |
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