Efficient use of full scan in transition fault testing /

Bibliographic Details
Main Author:	Saxena, Jayashree
Other Authors:	Pradhan, Dhiraj K.
Format:	Book
Language:	English
Published:	College Station, Tex. : Texas A & M University, Computer Science Dept., [1994]
Series:	Technical report. Texas A & M University. Computer Science Dept. ; TAMU 94-011
Subjects:	Fault-tolerant computing.

Cushing: Texas A&M (Does not check out)