Saxena, J., & Pradhan, D. K. (1994). Efficient use of full scan in transition fault testing. Texas A & M University, Computer Science Dept..
Chicago Style (17th ed.) CitationSaxena, Jayashree, and Dhiraj K. Pradhan. Efficient Use of Full Scan in Transition Fault Testing. College Station, Tex.: Texas A & M University, Computer Science Dept., 1994.
MLA (9th ed.) CitationSaxena, Jayashree, and Dhiraj K. Pradhan. Efficient Use of Full Scan in Transition Fault Testing. Texas A & M University, Computer Science Dept., 1994.
Warning: These citations may not always be 100% accurate.