Developments in x-ray tomography : 28-29 July 1997, San Diego, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Bonse, U.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1997]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3149.
Subjects:	Tomography > Congresses. X-rays > Congresses. Diagnostic imaging > Congresses.

Remote Storage