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Atomic force microscopy/scanning tunneling microscopy 2 /

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Bibliographic Details
Corporate Author: U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors: Cohen, Samuel H., Lightbody, Marcia L.
Format: Conference Proceeding Book
Language:English
Published: New York : Plenum Press, [1997]
Subjects:
Atomic force microscopy.
Scanning tunneling microscopy.
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Published 1997
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