Atomic force microscopy/scanning tunneling microscopy 2 /

Bibliographic Details

Corporate Author:	U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium
Other Authors:	Cohen, Samuel H., Lightbody, Marcia L.
Format:	Conference Proceeding Book
Language:	English
Published:	New York : Plenum Press, [1997]
Subjects:	Atomic force microscopy. Scanning tunneling microscopy.