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Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits.

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Bibliographic Details
Corporate Authors: International Symposium on the Physical & Failure Analysis of Integrated Circuits, Institute of Electrical and Electronics Engineers, IEEE. Singapore Section, IEEE Electron Devices Society
Format: Conference Proceeding
Language:English
Published: Piscataway, N.J. : IEEE Service Center.
Subjects:
Integrated circuits > Design and construction > Congresses.
Integrated circuits > Testing > Congresses.
Microelectronics > Research > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .I5737
Notes: Subscription converted to electronic format.
Library Owns: TK7874 .I5737 (5th-10th (1995-2003))
Call Number Status Get It
TK7874 .I5737 5th 1995 Available
TK7874 .I5737 6th 1997 Available
TK7874 .I5737 7th 1999 Available
TK7874 .I5737 8th 2001 Available
TK7874 .I5737 9th 2002 Available
TK7874 .I5737 10th 2003 Available