Cover Image

International Workshop on Statistical Metrology : [proceedings] : IWSM /

Bibliographic Details
Corporate Authors: International Workshop on Statistical Metrology, IEEE Electron Devices Society, Ōyō Butsuri Gakkai
Format: Conference Proceeding
Language:English
Published: Piscataway, NJ : IEEE, -[2001]
Subjects:
Semiconductors > Characterization > Statistical methods > Congresses.
Semiconductors > Measurement > Statistical methods > Congresses.
Description
Published:Began with the 1st held in Hawaii in June 1996.
-6th (June 10, 2001).
Item Description:Description based on: 2nd (June 8, 1997).
Physical Description:volumes : illustrations ; 28 cm.