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International Workshop on Statistical Metrology : [proceedings] : IWSM /

Bibliographic Details
Corporate Authors: International Workshop on Statistical Metrology, IEEE Electron Devices Society, Ōyō Butsuri Gakkai
Format: Conference Proceeding
Language:English
Published: Piscataway, NJ : IEEE, -[2001]
Subjects:
Semiconductors > Characterization > Statistical methods > Congresses.
Semiconductors > Measurement > Statistical methods > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7871.85 .I573
Library Owns: TK7871.85 .I573 (2nd-6th (1997-2001))
Call Number Status Get It
TK7871.85 .I573 2nd 1997 Available
TK7871.85 .I573 3rd 1998 Available
TK7871.85 .I573 4th 1999 Available
TK7871.85 .I573 5th 2000 Available
TK7871.85 .I573 6th 2001 Available