VLSI testing : digital and mixed analogue/digital techniques /

Bibliographic Details
Main Author:	Hurst, S. L. (Stanley Leonard)
Format:	Book
Language:	English
Published:	London : Institution of Electrical Engineers, [1998]
Series:	IEE circuits, devices and systems series ; v. 9.
Subjects:	Integrated circuits > Very large scale integration > Testing.

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