Cover Image

A unified approach for timing verification and delay fault testing /

Show other versions (1)
Bibliographic Details
Main Author: Sivaraman, Mukund, 1970-
Other Authors: Strojwas, Andrzej J.
Format: Book
Language:English
Published: Boston : Kluwer Academic, [1998]
Subjects:
Digital integrated circuits > Design and construction > Data processing.
Digital integrated circuits > Testing.
Electric fault location.
Integrated circuits > Verification.
Show all versions (2)