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A unified approach for timing verification and delay fault testing /

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Bibliographic Details
Main Author: Sivaraman, Mukund, 1970-
Other Authors: Strojwas, Andrzej J.
Format: Book
Language:English
Published: Boston : Kluwer Academic, [1998]
Subjects:
Digital integrated circuits > Design and construction > Data processing.
Digital integrated circuits > Testing.
Electric fault location.
Integrated circuits > Verification.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TK7874.65 .S58 1998
 
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TK7874.65 .S58 1998 Available