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A unified approach for timing verification and delay fault testing /

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Bibliographic Details
Main Author: Sivaraman, Mukund, 1970-
Other Authors: Strojwas, Andrzej J.
Format: Book
Language:English
Published: Boston : Kluwer Academic, [1998]
Subjects:
Digital integrated circuits > Design and construction > Data processing.
Digital integrated circuits > Testing.
Electric fault location.
Integrated circuits > Verification.
Description
Physical Description:xv, 155 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages [139]-152) and index.
ISBN:0792380797 (alk. paper)