Cover Image

Microcircuit device reliability : memory/digital LSI, winter 1981/82 /

Bibliographic Details
Main Authors: Dey, Kieron A., Turkowski, Wayne E. (Author)
Corporate Author: IIT Research Institute
Format: Book
Language:English
Published: Griffiss Air Force Base, N.Y. : Reliability Analysis Center, Rome Air Development Center, [1981]
Subjects:
Integrated circuits > Large scale integration > Reliability.
Computer storage devices > Reliability.
Description
Item Description:"Ordering number MDR-18."
Chiefly tables.
Physical Description:ix, 443 pages ; 28 cm.
Bibliography:Includes bibliographical references.