Microcircuit device reliability : memory/digital LSI, winter 1981/82 /

Bibliographic Details
Main Authors:	Dey, Kieron A., Turkowski, Wayne E. (Author)
Corporate Author:	IIT Research Institute
Format:	Book
Language:	English
Published:	Griffiss Air Force Base, N.Y. : Reliability Analysis Center, Rome Air Development Center, [1981]
Subjects:	Integrated circuits > Large scale integration > Reliability. Computer storage devices > Reliability.

Remote Storage