Polarimetry and ellipsometry : 20-23 May 1996, Kazimierz Dolny, Poland /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers. Poland Chapter, Institute of Applied Optics (Poland), Komitet Badań Naukowych (Poland), Society of Photo-optical Instrumentation Engineers
Other Authors:	Pluta, Maksymilian, Woliński, Tomasz R., Szyjer, Mariusz
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1997]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3094.
Subjects:	Polarimetry > Congresses. Ellipsometry > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/3094.toc

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