An integrated framework for synthesis for testability /

The work presented in this dissertation proposes a novel framework for design and synthesis applicable in the context of built-in-self-test, BIST, of circuits. This is the first framework which attempts to combine BIST test pattern generation techniques with circuit synthesis-for-test techniques....

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Bibliographic Details

Main Author:	Chatterjee, Mitrajit, 1970-
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1997.
Subjects:	Major computer science.
Online Access:	http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=739891241&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD