APA (7th ed.) Citation

Kwon, Y. (1996). VLSI yield learning via production functional test data. [publisher not identified].

Chicago Style (17th ed.) Citation

Kwon, Young-Jun. VLSI Yield Learning via Production Functional Test Data. [Place of publication not identified]: [publisher not identified], 1996.

MLA (9th ed.) Citation

Kwon, Young-Jun. VLSI Yield Learning via Production Functional Test Data. [publisher not identified], 1996.