VLSI yield learning via production functional test data /

Maximizing the slope of the semiconductor manufacturing yield ramp requires rapid failure analysis and continuous monitoring of the fabrication line. At the same time, since metrology is the fastest growing component of fab cost, there is an opposing pressure to eliminate measurements or demonstrat...

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Bibliographic Details

Main Author:	Kwon, Young-Jun
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1996.
Subjects:	Major computer science.
Online Access:	http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=739668241&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD