Process, equipment, and materials control in integrated circuit manufacturing III : 1-2 October 1997, Austin, Texas /

Microelectronics technology and process integration : 20-21 October 1994, Austin, Texas /
Published: (1994)

Multilevel interconnect technology : 1-2 October 1997, Austin, Texas /
Published: (1997)

Multilevel interconnect technology II : 23-24 September, Santa Clara, California /
Published: (1998)

Multilevel interconnect technology III : 22-23 September 1999, Santa Clara, California /
Published: (1999)

Microelectronic processes, sensors, and controls : 27-29 September 1993, Monterey, California /
Published: (1994)

Proceedings of the Symposium on Etching for Pattern Definition /
Published: (1976)

Plasma etching processes for interconnect realization in VLSI /
Published: (2015)

Ultrathin SiO₂ and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A. /
Published: (1999)

Advanced metallization and interconnect systems for ULSI applications in 1997 : proceedings of the conference held September 30-October 2,1997, in San Diego, California, sponsored by Continuing Education in Engineering, University Extension, University of California at Berkeley, California, U.S.A., a parallel session of the conference was held from October 21-22, 1997, in Tokyo, Japan /
Published: (1998)

Handbook of low and high dielectric constant materials and their applications /
Published: (1999)

Advanced metallization and interconnect systems for ULSI applications in 1996 : proceedings of the conference held October 1-3, 1996, in Boston, Massachusetts, sponsored by Continuing Education in Engineering, University Extension, University of California at Berkeley, California, U.S.A., a parallel session of the conference was held from October 23-24, 1996, in Tokyo, Japan /
Published: (1997)

Gate stack scaling : materials, role of interfaces, and reliability implications : April 17-21, 2006, San Francisco, California, USA.
Published: (2006)

Silicon Run Etch :
Published: (2015)

High dielectric constant materials : VLSI MOSFET applications /
Published: (2005)

Materials modification by energetic atoms and ions : Symposium held April 28-30, 1992, San Francisco, California, USA /
Published: (1992)

Handbook of low and high dielectric constant materials and their applications /
Published: (1999)

Manufacturing process control for microelectronic devices and circuits : 20-21 October 1994, Austin, Texas /
Published: (1994)

Integrated circuit metrology, inspection, and process control VII : 2-4 March 1993, San Jose, California /
Published: (1993)

Integrated circuit metrology, inspection, and process control III, 27-28 February 1989, Los Angeles, California /
Published: (1989)

Plasma processing XIII : proceedings of the International Symposium /
Published: (2000)

Dry etching for VLSI /
by: Roosmalen, A. J. van
Published: (1991)

Applications of plasma processes to VLSI technology /
Published: (1985)

Advanced techniques for integrated circuit processing : 1-5 October 1990, Santa Clara, California /
Published: (1991)

Integrated circuit manufacturability : the art of process and design integration /
Published: (1999)

Plasma processing and synthesis of materials III : symposium held April 17-19, 1990, San Francisco, California, U.S.A. /
Published: (1991)

Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October 1997, Austin, Texas /
Published: (1997)

Micron and submicron integrated circuit metrology : August 22-23, 1985, San Diego, California /
Published: (1985)

Submicrometer metallization : the challenges, opportunities, and limitations : 23-25 September 1992, San Jose, California /
Published: (1993)

Integrated circuit metrology : May 4-5, 1982, Arlington, Virginia /
Published: (1982)

Analysis and design of analog integrated circuits /
by: Gray, Paul R., 1942-, et al.
Published: (2024)

Integrated circuit metrology, inspection, and process control VIII : 28 February-2 March, San Jose, California /
Published: (1994)

Integrated circuit metrology, inspection, and process control : 4-6 March 1987, Santa Clara, California /
Published: (1987)

Microelectronics manufacturing, yield, and reliability : 20-21 October 1994, Austin, Texas /
Published: (1994)

Analog MOS integrated circuits, II /
Published: (1989)

Materials, technology and reliability for advanced interconnects--2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A /
Published: (2005)

Gate dielectrics and MOS ULSIs : principles, technologies, and applications /
by: Hori, Takashi, 1956-
Published: (1997)