Optimal testing for physically-based faults /

In this dissertation) we investigate optimal voltage testing and optimal local time delay testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two fault types: resistive bridges between gate outputs that cause pattern sensi...

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Bibliographic Details

Main Author:	Liao, Yuyun, 1963-
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1996.
Subjects:	Major electrical engineering.
Online Access:	http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=739669461&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD