Machine vision applications in industrial inspection V : 10-11 February 1997, San Jose, California /

Bibliographic Details
Corporate Authors:	IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors:	Ravishankar Rao, A., Zhang, Ning
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [1997]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 3029.
Subjects:	Quality control > Optical methods > Automation > Congresses. Computer vision > Congresses. Engineering inspection > Congresses.

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