Investigative image processing : 19-20, November, 1996, Boston, Massachusetts /

Bibliographic Details
Corporate Authors:	National Institute of Standards and Technology (U.S.), National Institute of Justice (U.S.), Society of Photo-optical Instrumentation Engineers
Other Authors:	Rudin, Leonid I., Bramble, Simon K.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1997]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 2942.
Subjects:	Law enforcement > Technological innovations > Congresses. Electronics in criminal investigation > Congresses. Forensic sciences > Congresses. Image processing > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/2942.toc

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